Characterizing Thin-Films

     • Ellipsometry

Ellipsometry uses focused light usually from two or more lasers operating at different wavelengths to examine the thickness and dielectric constant of materials comprising our thin-films. If the dielectric constant of the material is known, the technique can be used to characterize the nature of the pores in the material and to probe the dielectric properties of fluids in these pores. We know that water contained in these pores no longer has a dielectric constant of bulk water.